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Thermal Microscopes

Innovations in Infrared Microscopy for Industry and R&D

Optris Infrared MO series label

Optris thermal microscopes allow non-contact temperature measurement at the microscopic scale. These high-precision thermal cameras offer up to 2× magnification and excellent spatial resolution for uncooled detectors. They can resolve structures down to 8 µm and deliver infrared imaging performance that exceeds typical thermal microscopes. Designed for materials science, electronics prototyping, and research and development, they help with detailed thermal analysis and diagnostics. These microscopes reveal fine temperature distributions and material behavior that optical microscopes cannot see. Typical uses include diagnosing microelectronic failures, characterizing material properties, and ensuring strict quality control. This combination of microscopic detail and calibrated temperature data supports faster development cycles and more reliable electronic products.

Optris IR Microscopes

Why Optris Thermal Microscopes?

  • Crisp thermal imaging of small components down to 80 µm (Xi 400), 28 µm (PI 640i MO), or 8 µm (PI 640i MO2X)
  • Fully radiometric recording of thermal sequences with full measurement analysis available on every single frame on playback, with free PIX Connect software
  • Time vs. temperature data logging on any pixel in the scene is stored in CSV files for temperature trending on transient events
  • Hands-free operation

High-Precision Thermal Microscopy for Micro-Scale Components

Optris thermal microscope cameras enable highly detailed temperature measurement on extremely small electronic structures. Equipped with optics providing two-times magnification and spot sizes down to 8 µm, the system captures precise thermal data from tiny components on circuit boards and semiconductor devices. This capability allows engineers to identify hotspots, validate designs, and optimize reliability in electronics manufacturing, research laboratories, and quality assurance environments where microscopic thermal insight is essential.

Detect the Smallest Temperature Differences with High Thermal Resolution

Optris thermal microscope application packages provide exceptional thermal sensitivity, allowing users to detect even the smallest temperature differences on microscopic structures. With high optical resolution and excellent NETD performance, the system reveals subtle thermal variations that are nearly invisible to conventional measurement methods. This capability enables precise analysis of electronic assemblies, circuit boards, and microchips, helping engineers identify hotspots, verify thermal designs, and ensure reliable performance of sensitive electronic components.

True Radiometric Measurement for Every Pixel

Unlike basic heat cameras, Optris thermal microscopes offer fully radiometric data. Every pixel shows a calibrated temperature value. This allows for accurate spot and area measurements, automated pass or fail criteria, and trend analysis over time. The outcome is reliable thermal data for documentation, reporting, and design validation.

Optimized Optics for Superior Image Quality with Uncooled Detectors

The microscope optics are designed for high-resolution, uncooled bolometer detectors. This setup ensures a sufficient pixel count on small targets. The pairing of the detector and optics produces clear, low-noise thermal images without the added complexity and expense of cooled systems. Users enjoy a dependable, consistent, and affordable infrared imaging system in a compact, sturdy design.

Ready for Industrial and Lab Integration

Optris thermal microscopes integrate easily into laboratory benches and industrial setups via standard interfaces and software. Trigger inputs, data streaming, and flexible analysis tools support automated testing, characterization routines, and inline quality control. This allows you to move smoothly from prototype analysis to repeatable, production-grade thermal inspection.

Advanced Analysis with PIX Connect Software

PIX Connect turns the thermal microscope into a complete analysis workstation. It provides live radiometric video, flexible cursors and areas, time-temperature plots, and automated hot-spot detection directly on microscopic structures. Users can create templates for repeated measurements, export data and reports, and document thermal behavior over time without needing extra software.

Automation and Integration with OTC SDK

With the Optris Thermal Camera (OTC) SDK, the microscopes can be integrated into custom software, automated test rigs, and production lines. Developers access calibrated temperature data, control camera parameters, and trigger acquisitions from C/C++, .NET, Python, and other environments. This makes it straightforward to build bespoke thermal test routines, inline inspections, and fully automated characterization workflows.

The growing density of integration in new electronic designs means that heat from power loss is continually increasing. Another reason for the need for infrared microscope optics is ongoing miniaturization, which can reduce the effectiveness of heat dissipation. Applications that carry higher currents are becoming more common, particularly in drive technology, thanks to power electronics.

The lifespan of semiconductor elements depends heavily on temperature. A 10 °C increase in temperature can reduce lifespan by 50%. This places a challenge on developers of electronic assemblies, who must consider the thermal behavior of circuit boards and assemblies. The best way to measure the temperatures of semiconductors, printed circuit boards, or entire assemblies is through infrared technology. This method is quick, precise, and contact-free, which is especially important in electronics manufacturing. When measuring, it’s essential to check where a circuit board shows temperature variations. It’s also vital to ensure measurements are taken on high-emissivity surfaces, such as Teflon, Polyimide, fiberglass, and ceramics, rather than on metal surfaces that reflect infrared energy.

Several factors can cause excessive temperatures, such as defective components, incorrectly sized circuit paths, or poorly soldered joints. To accurately record the temperatures of tiny components and structures on a circuit board, a high-resolution infrared camera with microscope optics aimed at small targets is necessary. With the right camera and optics, you can clearly see which component on a printed circuit board exceeds its operating temperature.

Optris thermal microscopes open up a level of insight that conventional thermal cameras and optical microscopes simply cannot offer. By combining high-resolution uncooled infrared detectors with precision microscope optics, these systems resolve structures down to just a few micrometers while still delivering calibrated, radiometric temperature data. Every pixel in the image effectively acts as an infrared thermometer, turning tiny solder joints, semiconductor structures, and micro-mechanical parts into clearly mapped temperature profiles instead of vague hot-spot blobs.

It’s equally important to know when the thermal camera can accurately resolve a small component. Just because you can see on the thermal image where a lead connects to an integrated circuit doesn’t mean you can measure the temperature accurately. The infrared industry uses pixel size to indicate the resolving power of an infrared camera or microscope setup. However, a single pixel cannot capture all the radiant heat from a surface the size of a pixel, resulting in a lower temperature reading. Normally, a matrix of 3 x 3 pixels on the target is needed to provide an accurate temperature measurement according to the thermal camera’s specifications. If temperature is crucial, which it often is for electronic components, don’t rely solely on pixel size. Measurement Field of View (MFOV) is the key parameter that defines the size of the target that can be measured accurately.

For electronics, semiconductor, and materials laboratories, this means clearer answers in less time. Localized hot spots on ICs, power devices, and PCBs can be easily pinpointed, compared, and documented under realistic operating conditions. Subtle temperature gradients around bond wires, vias, or micro-cracks show up immediately, helping to validate designs, troubleshoot failures, and verify thermal models. Because the thermal microscopes are non-contact, sensitive structures stay intact and undisturbed throughout testing.

Infrared cameras have typically been used for design validation, but research is ongoing to incorporate Optris infrared cameras into the production phase of the reflow process. This integration aims to validate the temperature of the board and its components as they move through the oven. Optris PIX Connect software operates in line scan mode to collect temperature data along a single line through a small slit in the oven. The software converts this data from a single line into a complete thermal image of the board, using the board’s motion through the thermal camera’s field of view to reconstruct the vertical dimension. This research and other similar efforts aim to expand the use of infrared camera technology in the electronics field.

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